年度108
等級SCI
論文名稱Discussion of “Assessing the Goodness of Fit of Logistic Regression Models in Large Samples: A modification of the Hosmer-Lemeshow test,” by Giovanni Nattino, Michael L. Pennell, and Stanley Lemeshow
全部作者Li-Ching Chen; Jiun-Yi Wang
卷數Biometrics 76(2), p.569-571
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