講  題:Role of Industrial Statistics in High-Tech ICT Industry

主講人:曾勝滄 教授(國立清華大學統計學研究所)

時  間:20210311日(星期四)下午0210 - 0400

地  點:B302A(淡水校園商管大樓)

茶  會:20210311日(星期四)下午0130 (商管大樓 B1102)

 

摘 要

Information and communication technology (ICT) products (such as smart phone, ipad,and etc.) are widely used in our daily life. The quality and reliability of the key components in ICT devices are of great interests to both customers and the manufactures. In this talk, I will briefly introduce four related topics in ICT that thestatisticians can easily get involved.

(a) Fault detection and classification (FDC) of IC manufacturing process;

(b) Lifetime Assessments of Nano-Sol Products,

(c) Run-to-run (R2R) process control of IC manufacturing process; and

(d) End-of-performance (EOP) prediction of Lithium-ion batteries.


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更新日期 : 2021/06/11