:::
| Entry Year | 96 |
|---|---|
| Paper title (chapter) | A Goodness-of-Fit Test for GEE models with Binary Longitudinal Data Based on Smoothing Methods |
| Name of conference | 2007 International Conference on Innovative Computing, Information and Control, Kumamoto, Japan |
| Conference starting time | 2007-09-05 |
| Conference closing time | 2007-09-07 |
| Year of publication | 2007 |
| Name of author (Chinese) | Yi-Ju Chen |
| Name of author (English) | Yi-Ju Chen |
| sponsor | IEEE |
