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Faculty and staff

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Seminar paper
Entry Year96
Paper title (chapter)A Goodness-of-Fit Test for GEE models with Binary Longitudinal Data Based on Smoothing Methods
Name of conference2007 International Conference on Innovative Computing, Information and Control, Kumamoto, Japan
Conference starting time2007-09-05
Conference closing time2007-09-07
Year of publication2007
Name of author (Chinese)Yi-Ju Chen
Name of author (English)Yi-Ju Chen
sponsorIEEE
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