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Entry Year | 96 |
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Paper title (chapter) | A Goodness-of-Fit Test for GEE models with Binary Longitudinal Data Based on Smoothing Methods |
Name of conference | 2007 International Conference on Innovative Computing, Information and Control, Kumamoto, Japan |
Conference starting time | 2007-09-05 |
Conference closing time | 2007-09-07 |
Year of publication | 2007 |
Name of author (Chinese) | Yi-Ju Chen |
Name of author (English) | Yi-Ju Chen |
sponsor | IEEE |